Bridging Tribology and Microrheology of Thin Films

نویسندگان

  • CHRISTIAN CLASEN
  • H. PIROUZ KAVEHPOUR
  • GARETH H. MCKINLEY
چکیده

An enhanced version of the flexure-based microgap rheometer (FMR) is described which enables rheological measurements in steady state shearing flows of bulk fluid samples of PDMS with an absolute gap separation between the shearing surfaces of 100 nm – 100 μm. Alignment of the shearing surfaces to a parallelism better then 10 rad allows us to reliably measure shear stresses at shear rates up to 10 s. At low rates and for shearing gaps < 5 μm the stress response is dominated by sliding friction between the surfaces that is independent of the viscosity of the fluid and only determined by the residual particulate phase (dust particles) in the fluid. This behaviour is similar to the boundary lubrication regime in tribology. The absolute gap control of the FMR allows us to systematically investigate the flow behaviour at low degrees of confinement that cannot be accessed with conventional (controlled normal load) tribological test protocols.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Fabrication of MgF2-SiO2 Nanocomposite Thin Films and Investigation of Their Optical and Hydrophobic Properties

In this research, MgF2-2%SiO2/MgF2 thin films were applied on a glass substrate. At first, MgF2 thin films with the optical thickness were deposited on the glass slide substrates. Then, MgF2-2%SiO2 thin films were deposited on the glass coated with MgF2 thin films. Finally, the nanocomposite thin films were surface treated by the PFTS solution. Characterization of the thin film was done by X-Ra...

متن کامل

Correlation between crystal structure and optical properties of copper- doped ZnO thin films

ZnO and Cu doped[1] (CZO) thin films were prepared by radio frequency sputtering. The structural and optical properties of thin films were investigated using X-ray diffraction (XRD), atomic force microscopy (AFM), optical spectrophotometer, and photoluminescence (PL) techniques. ZnO thin films showed crystalline and micro-stress defects in the crystal lattice. Annealing of CZO thin films increa...

متن کامل

The effect of Ga-doping on the structural and optical properties of ZnO thin films prepared by spray pyrolysis

In this research, zinc oxide thin films with gallium impurity have been deposited using the spray pyrolysis technique. The structural and optical properties of these films are investigated as a function of gallium doping concentrations. The ZnO and ZnO:Ga  films grown at a substrate temperature of 350 ºC with gallium doping concentrations from 1.0 to 5.0.%. The XRD analysis indicated that ZnO f...

متن کامل

Nano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy

ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...

متن کامل

Investigations on structural and electrical properties of Cadmium Zinc Sulfide thin films

Nowadays, II – IV group semiconductor thin films have attracted considerable attention from the research community because of their wide range of application in the fabrication of solar cells and other opto-electronic devices. Cadmium zinc sulfide (Zn-CdS) thin films were grown by chemical bath deposition (CBD) technique. X-ray diffraction (XRD) is used to analyze the structure and crystallite ...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2009